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  1. Pubblicazioni

Monitoring of historical frescoes by timed infrared imaging analysis

Articolo
Data di Pubblicazione:
2015
Abstract:
The subflorescence and efflorescence phenomena are widely acknowledged as the major causes of permanent damage
to fresco wall paintings. They are related to the occurrence of cycles of dry/wet conditions inside the walls. Therefore, it is
essential to identify the presence of water on the decorated surfaces and inside the walls.
Nondestructive testing in industrial applications have confirmed that active infrared thermography with continuous timed
images acquisition can improve the outcomes of thermal analysis aimed to moisture identification. In spite of that, in
cultural heritage investigations these techniques have not been yet used extensively on a regular basis. This paper
illustrates an application of these principles in order to evaluate the decay of fresco mural paintings in a medieval chapel
located in North−West of Italy. One important feature of this study is the use of a robotic system called aIRview that can
be utilized to automatically acquire and process thermal images. Multiple accurate thermal views of the inside walls of the
building have been produced in a survey that lasted several days. Signal processing algorithms based on Fast Fourier
Transform analysis have been applied to the acquired data in order to formulate trustworthy hypotheses about the
deterioration mechanisms.
Tipologia CRIS:
1.1 Articolo su Rivista
Keywords:
infrared thermography; thermal imaging; fresco detachment; moisture detection; cultural heritage monitoring; building survey
Elenco autori:
Cadelano, G.; Bison, P.; Bortolin, A.; Ferrarini, G.; Peron, Fabio; Girotto, M.; Volinia, M.
Autori di Ateneo:
PERON FABIO
Link alla scheda completa:
https://air.iuav.it/handle/11578/255021
Link al Full Text:
https://air.iuav.it//retrieve/handle/11578/255021/70354/OptoElectronic%20Review%202015%20novalesa.pdf
Pubblicato in:
OPTO-ELECTRONICS REVIEW
Journal
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URL

https://www.degruyter.com/view/journals/oere/23/1/article-p102.xml
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